Poly Si Pattern Wafers

Poly-Si (Polysilicon) Patterned Wafers

Poly-Si (polycrystalline silicon) patterned wafers are fabricated by depositing a Poly-Si film on an insulating film, such as thermal oxide, and patterning it into the specified geometry.

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40 nm Fine Pattern Fabrication

The 40 nm pattern is a fabrication example in which a line-and-space (L&S) resist pattern was formed, narrowed by resist trimming, and then used as a mask to transfer the pattern into Poly-Si.

This method produces fine Poly-Si lines.

Principle of Resist Trimming (Slimming)

Resist trimming generally uses an oxygen-containing plasma to etch the patterned resist and reduce its line width.

Etching Poly-Si with the narrowed resist as a mask transfers that line width into the Poly-Si. In the diagrams, CD denotes line width, PR denotes photoresist, and SiO2 denotes thermal oxide.

Resist L&S Patterning

Process cross-section labeled PR, poly-Si, SiO2, and Si, with a double-headed arrow indicating the resist CD of 80 nm before slimming
An L&S resist pattern with a CD of 80 nm before slimming is formed on the Poly-Si film.

Resist Trimming

Process cross-section labeled PR, poly-Si, SiO2, and Si, with a double-headed arrow indicating the resist CD of 40 nm after slimming
Both sidewalls of the resist are etched to reduce the CD from 80 nm to 40 nm while maintaining the pitch.

Poly-Si Etching

Process cross-section showing pattern transfer into Poly-Si using the resist as a mask, with a double-headed arrow indicating a line width of 40 nm
The resist with a CD of 40 nm is used as a mask to transfer the same line width into Poly-Si.

Resist Removal

Process cross-section after resist removal, with double-headed arrows indicating a Poly-Si line width of 40 nm and height of 125 nm
After resist removal, a Poly-Si pattern with a line width of 40 nm and a height of 125 nm remains.

SEM Images of the 40 nm Pattern

Side-by-side cross-sectional and plan-view SEM images of fine Poly-Si lines
Left: line width 40 nm / height 125 nm; right: plan view

250 nm L&S Pattern Fabrication

The 250 nm L&S pattern is a fabrication example with alternating lines and spaces formed in a thick Poly-Si film.

Cross-Sectional SEM

Cross-sectional SEM of a d-PolySi/SiO2/Si stack with a lateral dimension of 500 nm and a height of 446 nm
Lateral dimension 500 nm / height 446 nm