Evaluation Examples (Test Wafers)

Example) 200mm AL daisy chain evaluation

Test Wafers

Feb 16, 2024

This is an example of daisy chain evaluation of AL using
our daisy chain pattern (PT027).
Electrical continuity and reliability can be evaluated by
combining A1 and B1 or A2 and B2.
It is also possible to use Cu or Si instead of AL.
It is also possible to use NiAu bumps instead of SnAg bumps.

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